Designation: E 2085 – 00aAn American National StandardStandard Guide onSecurity Framework for Healthcare Information...
Designation: F 399 – 00aStandard Test Method forThickness of Heteroepitaxial or Polysilicon Layers 1This standard ...
Designation: F 525 – 00aStandard Test Method forMeasuring Resistivity of Silicon Wafers Using a SpreadingResistance...
Designation: F 110 – 00aStandard Test Method forThickness of Epitaxial or Diffused Layers in Silicon by theAngle...
Designation: A 808/A 808M – 00aStandard Specification forHigh-Strength, Low-Alloy Carbon, Manganese, Columbium,Vanadiu...

