Designation: E 2183 – 02An American National StandardStandard Guide forXML DTD Design, Architecture and Implementat...
Designation: E 402 – 02Standard Test Method forSpectrographic Analysis of Uranium Oxide (U3O8) byGallium Oxide-Carr...
Designation: F 1188 – 02Standard Test Method forInterstitial Atomic Oxygen Content of Silicon by InfraredAbsorption...
Designation: E 2219 – 02Standard Practice forValuation and Management of Moveable, Durable Property1This standard i...
Designation: F 1343 – 02Standard Specification forAnesthetic Gas Scavenging Systems—Transfer andReceiving Systems1Thi...
Designation: E 792 – 02An American National StandardStandard Guide forSelection of a Clinical Laboratory Informatio...
Designation: F 951 – 02Standard Test Method forDetermination of Radial Interstitial Oxygen Variation inSilicon Wafe...
Designation: E 1626 – 02An American National StandardStandard Guide forIncluding Government Procurement Requirements...
Designation: E 2200 – 02Standard Specification forInformation Included with Packaging of Multi-CellularBiological Con...
Designation: F 1726 – 02Standard Guide forAnalysis of Crystallographic Perfection of Silicon Wafers1This standard i...
Designation: E 1902 – 02An American National StandardStandard Specification forManagement of the Confidentiality and...
Designation: F 1390 – 02Standard Test Method forMeasuring Warp on Silicon Wafers by AutomatedNoncontact Scanning1Th...
Designation: F 1049 – 02Standard Practice forShallow Etch Pit Detection on Silicon Wafers1This standard is issued...
Designation: F 978 – 02Standard Test Method forCharacterizing Semiconductor Deep Levels by TransientCapacitance Tech...
Designation: F 1727 – 02Standard Practice forDetection of Oxidation Induced Defects in Polished SiliconWafers1This ...
Designation: F 1809 – 02Standard Guide forSelection and Use of Etching Solutions to DelineateStructural Defects in...
Designation: E 1469 – 02Standard Practice forCollecting Benthic Macroinvertebrates with Multiple-PlateSamplers1This st...
Designation: F 154 – 02Standard Guide forIdentification of Structures and Contaminants Seen onSpecular Silicon Surf...
Designation: E 2221 – 02Standard Practice forAdministrative Control of Property1This standard is issued under the ...
Designation: F 397 – 02DIN 50430Standard Test Method forResistivity of Silicon Bars Using a Two-Point Probe1This ...
ASME BPVC IX-2023 中文扫描版 焊接.pdf94365页
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NBIC NB 23-2025 Part 2 — Inspection.pdf142413页
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